01 / Wafer TestCP (Chip Probe)

The KYEC E320BD machine is used for chip probe testing.
Test items include: UserPowerON, Relay_OS, OS, power_short, Relay_RST, A01_IDD_StandBy, A02_IDD_ShutDown, Digital_Start, opif_rd_h02_id_b10099_E/F, ATPG_40MHz_E/F and ATPG_10MHz_E/F.









